IMAGING THE LOCAL ELECTRICAL-PROPERTIES OF METAL-SURFACES BY ATOMIC-FORCE MICROSCOPY WITH CONDUCTING PROBES - RESPONSE

Authors
HOUZE F MEYER R SCHNEEGANS O BOYER L
Citation
F. Houze et al., IMAGING THE LOCAL ELECTRICAL-PROPERTIES OF METAL-SURFACES BY ATOMIC-FORCE MICROSCOPY WITH CONDUCTING PROBES - RESPONSE, Applied physics letters, 70(26), 1997, pp. 3619-3619
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
70
Issue
26
Year of publication
1997
Pages
3619 - 3619
Database
ISI
SICI code
0003-6951(1997)70:26<3619:ITLEOM>2.0.ZU;2-Y