A corrected 3D Ewald calculation of the low effective temperature properties of the electrochemical interface

Citation
Ps. Crozier et al., A corrected 3D Ewald calculation of the low effective temperature properties of the electrochemical interface, CHEM P LETT, 325(5-6), 2000, pp. 675-677
Citations number
7
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CHEMICAL PHYSICS LETTERS
ISSN journal
00092614 → ACNP
Volume
325
Issue
5-6
Year of publication
2000
Pages
675 - 677
Database
ISI
SICI code
0009-2614(20000804)325:5-6<675:AC3ECO>2.0.ZU;2-0
Abstract
The corrected 3D Ewald method is used to verify charged sheets method resul ts that show increasing double-layer capacitance with increasing temperatur e in the low effective temperature region. The restricted primitive model i s used where ions are represented as charged hard spheres and the solvent i s represented by a uniform dielectric constant. It is shown that the capaci tance temperature plot for the test system exhibits increasing capacitance with increasing temperature in the low effective temperature region, which contradicts common theories of the electrochemical interface. For this syst em, the corrected 3D Ewald method results coincide well with the charged sh eets method results. (C) 2000 Elsevier Science B.V. All rights reserved.