A method for reducing the reflections from silicon optics at terahertz freq
uencies has been investigated. In this study, we used thin films of parylen
e as an anti-reflection (AR) layer for silicon optics and show low-loss beh
avior well above 1 THz. Transmittance spectra are acquired on double-sided-
parylene-coated, high-resistivity, single-crystal silicon etalons between 0
.45 THz and 2.8 THz. Modeling the optical behavior of the three-layer syste
m allowed fur the determination of the refractive index and absorption coef
ficient of parylene at these frequencies. Our data indicate a refractive in
dex, n, of 1.62 for parylene C and parylene D, and a reasonably modest abso
rption coefficient make these materials a suitable AR coating for silicon a
t terahertz frequencies. Coatings sufficiently thick for AR performance red
uced the average transmittance of the three-layer system by <10% compared t
o a lossless AR coating with an ideal refractive index.