Pulsed-laser deposition (PLD) is a very powerful and rapid deposition techn
ique, which can produce exceptional-quality thin films. Although PLD has tr
emendous versatility and potential, PLD capabilities are still constrained
by a lack of process control. At the Air Force Research Laboratory on-site
at Wright-Patterson AFB, we are developing in-situ/real-time control method
ologies for PLD and other thin-film deposition processes. We have identifie
d appropriate sensors for closed-loop feedback control and utilized them wi
th YBa2Cu3O7-x, (YBCO) to identify critical process control parameters. Con
trol instrumentation has recently been improved by the addition of moveable
fixed-position plume-emission sensors. The reproducibility of YBCO film qu
ality increased significantly when process control was applied to PLD proce
ssing.
PLD process control techniques were applied during simulated and actual BST
O depositions. A comparison of deposition control with the controlling sens
or at different distances from the substrate heater position is discussed.
Further process refinement using Lime-resolved spectral components of the P
LD plume on subsequent film quality is also discussed.