R. Welter et al., Single crystal refinements of TbTiGe, GdTiGe and TbTi0.85Mo0.15Ge with CeFeSi- and CeScSi-type structures, J ALLOY COM, 307, 2000, pp. 207-211
The atomic coordinates of the TbTi0.85Mo0.15Ge, GdTiGe and TbTiGe compounds
have been refined from single crystal X-ray diffraction measurements. Both
former compounds have a tetragonal CeScSi-type structure (14/mmm, ordered
variant of the La,Sb-type) while TbTiGe crystallizes in the CeFeSi-type (P4
/nmm). The structural properties and the relative stability of both CeFeSi
and CeScSi-type structures along the whole RTiGe series (R=La-Nd, Sm, Gd-Tm
, Lu) are discussed and compared to those of others isotypic RTX compounds.
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