Nickel thin films were deposited with Ni(C5H5)(2) [NiCp2, bis(cyclopentadie
nyl)nickel, nickelocene]/H-2 at various temperatures and H-2/Ar ratios. The
deposition rate, resistivity, purity, crystal structure, and surface morph
ology of the nickel film were investigated. Also, thermal analysis was done
to find out the dissociation characteristics of NiCp2, and Fourier transfo
rm infrared spectroscopy diagnostics were carried out to study the gas phas
e reaction kinetics of NiCp2. Nickel films deposited at higher temperatures
(>225 degrees C) had high carbon content and high resistivity. At higher t
emperatures, thermal decomposition of NiCp2 and subsequent decomposition of
Cp induced a large amount of carbon incorporation into the film. At lower
temperatures (<190 degrees C), the slow dissociation of NiCp led to some ex
tent of carbon incorporation in the film. Nickel films deposited at around
200 degrees C showed carbon content lower than 5% and lower resistivity bec
ause of the effective dissociation of Ni-Cp and desorption of Cp from the s
urface. Nickel films deposited with hydrogen addition showed higher purity,
crystallinity, and lower resistivity due to the removal of the carbon on t
he surface.