In this study, CuInSe2 thin films were prepared by the rapid thermal treatm
ent (RTP) of metallic precursors in a close-spaced graphite container. The
thermal diffusion process of selenium into the InSe/Cu/InSe precursor stack
s critically influenced the structural properties (i.e., morphological feat
ures, formation of crystalline phases and in-depth compositional uniformity
) of the films. In cases where pure elemental Se layers were incorporated i
nto the stacks (i.e., InSe/Cu/InSe/Se), RTP treatment yielded compound film
s with poor structural properties. Single-phase material with uniform and d
ense surface morphologies was obtained when InSe/Cu/InSe precursors were re
acted to an elemental Se atmosphere during RTP treatment. In these cases, s
ingle Se pellets were placed in close proximity to the samples in a partial
ly closed graphite container. The container was then rapidly heated in 1 mi
n to 550 degrees C, followed by a reaction period of 6 min at this temperat
ure. X-ray fluorescence (XRF) K-alpha 1,K-2 line intensity measurements fro
m these specific samples, after different stages of etching, revealed a rel
atively high degree of in-depth compositional uniformity. The deposition of
this high quality material with a relatively simple and rapid two-stage te
chnique represents an important technological advantage.