Citation
Sm. Bennington et al., In situ diffraction measurement of the polymerization of C-60 at high temperatures and pressures, J PHYS-COND, 12(28), 2000, pp. L451-L456
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
09538984
→ ACNP
Volume
12
Issue
28
Year of publication
2000
Pages
L451 - L456
Database
ISI
SICI code
0953-8984(20000717)12:28<L451:ISDMOT>2.0.ZU;2-S
Abstract
In situ energy dispersive x-ray measurements were performed on C-60 fullere
ne at pressures of 2.6, 5.7 and 12 GPa and temperatures between 300 and 110
0 K. The polymerization process was followed in detail and the dynamics of
the phase changes measured This has enabled us to map the P-T phase diagram
and look at the dynamics of the phase transformations.