The temperature dependence of peak widths in high-resolution angle-resolved
photoelectron spectroscopy from quantum well states in ultra-thin Ag films
on V(100) has been used to determine the electron-phonon coupling constant
, lambda, for films of thickness 1-8 layers. A strong oscillatory variation
in coupling strength is observed as a function of film thickness, peaking
at a two layer film for which lambda similar or equal to 1.0. A simple theo
ry incorporating interaction of the photo-hole with the thermal vibrations
of the potential step at the adlayer-vacuum interface is shown to reproduce
the main features of these results.