Constrained film sintering of nanocrystalline TiO2

Citation
M. Stech et al., Constrained film sintering of nanocrystalline TiO2, J AM CERAM, 83(8), 2000, pp. 1889-1896
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
ISSN journal
00027820 → ACNP
Volume
83
Issue
8
Year of publication
2000
Pages
1889 - 1896
Database
ISI
SICI code
0002-7820(200008)83:8<1889:CFSONT>2.0.ZU;2-W
Abstract
The sintering of thin, nanocrystalline TiO2 films either 140 or 65 nm thick is characterized and compared with the sintering of bulk material. Grain s ize, pore size distribution, and density data are obtained. Observation of the microstructural evolution during sintering suggests that grain growth, as well as pore growth, at low density can be attributed to differential si ntering, ii continuum mechanical model for the intermediate stage is useful until the grain size becomes one-half the film thickness. From then on, th e ratio of grain size to film thickness affects the degree by which both de nsification and grain growth decrease, as compared with the continuum compu tation results.