Jp. Dong et Gz. Mao, Direct study of C12E5 aggregation on mica by atomic force microscopy imaging and force measurements, LANGMUIR, 16(16), 2000, pp. 6641-6647
Atomic force microscopy (AFM) was used to study the aggregation structure a
nd kinetics of nonionic surfactant penta(oxyethylene) dodecyl ether (C12E5)
On mica as a function of temperature. Surface forces and topographical ima
ges of surfactant aggregates at the liquid/solid interface were captured in
the vicinity of 21 degrees C. The surfactant molecular aggregates were ima
ged by choosing an imaging force in the steric repulsion region so that the
AFM tip was just outside the surface of the aggregates. At below 21 degree
s C, C12E5 adsorbed as fragments of tens of nanometers in size. The fragmen
ts consist of 1-2 nm thick strongly adsorbed species and weakly adsorbed sp
ecies extending as far as 15 nm from the substrate surface. The fragments g
radually increased in number and attached to each other to form clusters co
nnected in one dimension (strings) and two dimensions (networks). With incr
easing surface coverage, the surface force changed from a purely attractive
one to one showing a repulsive force barrier; At above 21 degrees C, a smo
oth and continuous layer structure formed instantaneously. Scan damage in t
he form of ever-expanding holes was observed in the surfactant layers. The
force versus distance profiles suggest continuous bilayers formed on both m
ica and AFM tip with a thickness of 4 nm. The abrupt changes in the aggrega
te structure and adsorption rate point to a phase transition at the surface
s, which originates from the temperature-induced dehydration of the headgro
up as in the cloud point phenomenon. This correlation was also supported by
the evidence that the adsorption of C12E5 was suppressed by the addition o
f a salting-in compound, sodium perchlorate.