Tri-layer systems for nanoimprint lithography with an improved process latitude

Citation
A. Lebib et al., Tri-layer systems for nanoimprint lithography with an improved process latitude, MICROEL ENG, 53(1-4), 2000, pp. 175-178
Citations number
5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
53
Issue
1-4
Year of publication
2000
Pages
175 - 178
Database
ISI
SICI code
0167-9317(200006)53:1-4<175:TSFNLW>2.0.ZU;2-L
Abstract
We present two tri-layer systems which can be used to improve the process l atitude of nanoimprint lithography. By hot empossing, the top layer polymer can easily deformed while the bottom layer, separated by a 10 nm thick ger manium from the top layer, remains to be thermally stable. With a sequentia l reactive ion etching, the top layer image can be transferred into the bot tom layer with a large thickness contrast, thereby providing a way to gener ate dense features with high aspect ratio. Consequently, commonly used patt ern-transfer techniques such as lift-off, reactive ion etching and electrod eposition can be employed.