J. Taniguchi et al., Beam-assisted-etching technique for fabrication of single crystal diamond field emitter tip, MICROEL ENG, 53(1-4), 2000, pp. 415-418
We fabricated a single crystal diamond field emitter tip using focused ion
beam assisted etching and investigated characteristics of electron emission
from single crystal diamond. Electron emission from single crystal diamond
is field emission. FIB assisted etching is very useful to reduce emission
site.