Development mechanism study by dissolution monitoring of positive methacrylate photoresists

Citation
I. Raptis et al., Development mechanism study by dissolution monitoring of positive methacrylate photoresists, MICROEL ENG, 53(1-4), 2000, pp. 489-492
Citations number
5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
53
Issue
1-4
Year of publication
2000
Pages
489 - 492
Database
ISI
SICI code
0167-9317(200006)53:1-4<489:DMSBDM>2.0.ZU;2-W
Abstract
The development mechanisms of two polymethacrylate non-chemically amplified resists are investigated and compared using dissolution-monitoring experim ents and simulation. The first of these two resists is PMMA and the second an experimental Hydroxy functionalised PolyMethacrylate Positive resist (HP MAP). The imaging chemistries of the two resists are closely related, but d ifferent dissolution mechanisms are revealed with this study. Swelling phen omena are encountered in the hydroxy functionalised material, although an a queous base developer is used in this case.