We have studied the magnetoresistance and I-V characteristics of polyc
rystalline La2-xSrxCuO4-yCly samples as a function of temperature. Mea
surements were performed at temperatures near T-c and results were mod
eled taking into account the effect of thermal fluctuations as propose
d by the Ambegaokar-Halperin model, the Anderson-Kim flux creep theory
and the collective flux creep model (CFC). At low voltage, sub-ohmic
results are better described by the CFC model. We found that the tempe
rature dependence of the critical current density without thermal fluc
tuations indicates the presence of insulating barriers for non-chlorin
ated samples and metallic barriers for chlorinated samples. The obtain
ed parameter mu similar or equal to 0.25 for both samples is, within t
he CFC model, in agreement with a picture where non-interacting vortic
es are pinned in a bidimensional defect array. (C) 1997 Elsevier Scien
ce B.V.