The phenomenon of multiple localization in a Mach-Zender interferometer ill
uminated by a system of incoherent equidistant linear sources is studied. T
he relation between multilocalization and diffraction at a grating of perio
d equal to the spacing between the sources composing the illumination syste
m is analysed. Using the former relation an adjustment method is developed
for interferometers of separated beams. This method enables the interferenc
e fringes at the different focalization planes to be seen without readjusti
ng the alignment. This enables to observe perturbations at different planes
with the pimple focalization of the camera.