Sieve calibration - a new simple but high precision approach

Citation
Gr. Rideal et al., Sieve calibration - a new simple but high precision approach, PART PART S, 17(2), 2000, pp. 77-82
Citations number
9
Categorie Soggetti
Chemical Engineering
Journal title
PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION
ISSN journal
09340866 → ACNP
Volume
17
Issue
2
Year of publication
2000
Pages
77 - 82
Database
ISI
SICI code
0934-0866(200007)17:2<77:SC-ANS>2.0.ZU;2-K
Abstract
This paper describes the preparation, measurement and use of microspheres f or calibrating individual test sieves. Using a 63 mu m sieve as an example, 2.5 million apertures, or 80% of the surface is examined in under 2 minute s. Because of the narrowness of the size distribution, a 5% difference in p ercent passing only results in a mean aperture difference of 1 mu m, indeed , the measurement uncertainty for all 24 tests performed was only 0.7 mu m The calibration is independent of the method of shaking and can be used for most sieves.