Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection X-ray topography

Authors
McNally, PJ Dilliway, G Bonar, JM Willoughby, A Tuomi, T Rantamaki, R Danilewsky, AN Lowney, D
Citation
Pj. Mcnally et al., Observation of misfit dislocation strain-induced surface features for a Si/Ge-Si heterostructure using total reflection X-ray topography, PHYS ST S-A, 180(1), 2000, pp. R1-R3
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
180
Issue
1
Year of publication
2000
Pages
R1 - R3
Database
ISI
SICI code
0031-8965(20000716)180:1<R1:OOMDSS>2.0.ZU;2-#