Mc. Cyrille et al., Enhancement of perpendicular and parallel giant magnetoresistance with thenumber of bilayers in Fe/Cr superlattices, PHYS REV B, 62(5), 2000, pp. 3361-3367
We have correlated a detailed quantitative structural analysis by x-ray dif
fraction, transmission electron microscopy, and high spatial resolution ele
ctron energy-loss spectroscopy imaging, with the magnetization and anisotro
pic magnetotransport properties in sputtered Fe/Cr superlattices. To accomp
lish this, we developed a technique for magnetotransport measurements in me
tallic superlattices with the current perpendicular to the plane of the lay
ers (CPP). Using microfabrication techniques, we have fabricated microstruc
tured Fe/Cr pillars embedded in SiO2 and interconnected with Nb electrodes.
Because of the uniform current distribution in the Nh electrodes and the m
inimization of the superlattice-electrode contact resistance, the method al
lows a simple and independent measurement of the superlattice resistance an
d giant magnetoresistance (GMR). Structural and magnetic characterization o
f [Fe(3 nm)/Cr (1.2 nm)](N) superlattices (where N is the number of repetit
ions) indicate that the roughness is correlated and increases cumulatively
through the superlattice stack with no significant change in the antiferrom
agnetic coupling. Both the current in-plane and CPP GMR increase with N as
the roughness increases.