Wetting layer thickness and early evolution of epitaxially strained thin films

Citation
Hr. Eisenberg et D. Kandel, Wetting layer thickness and early evolution of epitaxially strained thin films, PHYS REV L, 85(6), 2000, pp. 1286-1289
Citations number
16
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
85
Issue
6
Year of publication
2000
Pages
1286 - 1289
Database
ISI
SICI code
0031-9007(20000807)85:6<1286:WLTAEE>2.0.ZU;2-C
Abstract
We propose a physical model which explains the existence of finite thicknes s wetting layers in epitaxially strained films. The finite wetting layer is shown to be stable due to the variation of the nonlinear elastic free ener gy with film thickness. We show that anisotropic surface tension gives rise to a metastable enlarged wetting layer. The perturbation amplitude needed to destabilize this wetting layer decreases with increasing lattice mismatc h. We observe the development of faceted islands in unstable films.