Growth of the Ge overlayer on Si(100)-(2 x 1)

Citation
Tw. Pi et al., Growth of the Ge overlayer on Si(100)-(2 x 1), SURF SCI, 461(1-3), 2000, pp. L565-L569
Citations number
25
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
461
Issue
1-3
Year of publication
2000
Pages
L565 - L569
Database
ISI
SICI code
0039-6028(20000801)461:1-3<L565:GOTGOO>2.0.ZU;2-U
Abstract
The initial stages of the development of a Ge adatom layer on a clean Si(00 1)-(2 x 1) surface are consistent with random deposition and limited surfac e mobility. A critical comparison of the rate of attenuation of the Si buck led dimer up-atom signal by Ge deposition with the growth of the two well-r esolved features of the Ge adatom spectrum rules out the substitution of Ge into the Si dimers. Instead, Ge is captured by the dangling bonds of the S i dimers and remains on the surface, initially dominantly as isolated Ge at oms, then as dimers, and finally in islands or clusters. (C) 2000 Elsevier Science B.V. All rights reserved.