APPLICATION OF RTOF FOR INTEGRATED SUBSTRUCTURE-ANALYSIS IN POLYCRYSTALLINE MATERIALS

Authors
KSCHIDOCK T KLIMANEK P PRIESMEYER HG
Citation
T. Kschidock et al., APPLICATION OF RTOF FOR INTEGRATED SUBSTRUCTURE-ANALYSIS IN POLYCRYSTALLINE MATERIALS, Physica. B, Condensed matter, 234, 1997, pp. 962-964
Citations number
6
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
234
Year of publication
1997
Pages
962 - 964
Database
ISI
SICI code
0921-4526(1997)234:<962:AORFIS>2.0.ZU;2-8
Abstract
Integrate substructure analysis in polycrystals is often based on the interpretation of physical diffraction-line broadening. In the present work the case of high-resolution neutron diffraction by means of RTOF is considered in comparison with the angular-dispersive neutron diffr actometry. First experimental results indicate that RTOF can successfu lly be used for the determination of physical line-broadening.