Failure mechanisms and recent improvements in ZnO arrester elements

Authors
Andoh, H Nishiwaki, S Suzuki, H Boggs, S Kuang, J
Citation
H. Andoh et al., Failure mechanisms and recent improvements in ZnO arrester elements, IEEE ELEC I, 16(1), 2000, pp. 25-31
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRICAL INSULATION MAGAZINE
ISSN journal
08837554 → ACNP
Volume
16
Issue
1
Year of publication
2000
Pages
25 - 31
Database
ISI
SICI code
0883-7554(200001/02)16:1<25:FMARII>2.0.ZU;2-R