Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

Authors
Bruce, S Vandamme, LKJ Rydberg, A
Citation
S. Bruce et al., Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors, IEEE DEVICE, 47(9), 2000, pp. 1772-1773
Citations number
2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
47
Issue
9
Year of publication
2000
Pages
1772 - 1773
Database
ISI
SICI code
0018-9383(200009)47:9<1772:ICMUVA>2.0.ZU;2-N
Abstract
A method is presented to improve accuracy in low-frequency noise characteri zation of bipolar transistors by using both a voltage amplifier and transim pedance amplifiers.