In this paper, we carry out a full-wave analysis of shielded two-port micro
strip circuits, in which the metallizations are embedded in a multilayered
substrate that may contain isotropic dielectrics and/or anisotropic dielect
rics, The Galerkin's method in the spectral domain is applied for determini
ng the current density on the metallizations of the circuits when their fee
ding lines are excited by means of delta-gap generators, and the matrix pen
cil technique is subsequently used for deembedding the scattering parameter
s from the computed current densities, Results are presented for the scatte
ring parameters of some microstrip discontinuities and tilters printed on b
oth isotropic dielectric substrates and anisotropic dielectric substrates,
These results show that when substrate dielectric anisotropy is ignored, er
rors arise when computing the scattering parameters of microstrip discontin
uities and when predicting the operating frequency band of microstrip filte
rs.