Determination of metal-ligand stoichiometries for inorganic complexes using total reflection X-ray fluorescence

The methods usually used to determine the ratio metal-ligand in inorganic c omplexes require a set of solutions with different concentrations for both the ligand and metal. We propose a new method using the total reflection X- ray fluorescence technique, in which the ratio between metal and ligand is determined precisely, easily, and quickly. Experimental results provide evi dence that for different chemical complexes, the ligand-metal ratio determi ned by this technique deviates at most from stoichiometric values by 6%. Th e technique is restricted usually to elements with Z above 14, and its dete ction limit is on the order of 10(-8) g/g.