Morphology characterization of high-impact resistant polypropylene using AFM and SALS

Atomic force microscopy and small angle light scattering have been used to characterize the morphology of high-impact polypropylene. Because of sample preparation requirements, both techniques are relatively simple compared w ith conventional electron microscopy approaches. Using atomic force microsc opy the spatial distribution of the impact-modifying ethylene-propylene rub ber (EPR) domains could be readily identified whereas small angle light sca ttering was used to quantify overall domain size distribution. EPR domains from a few hundred nanometers to a few microns in size were observed with a verage sizes that vary from the edge to the center of the polypropylene par ticle. In addition, it has been observed that the morphology shifts from di screte domains to bicontinuous as the EPR content is increased. (C) 2000 Jo hn Wiley & Sons, Inc.