Advances in photoionization and photoelectron studies using third generation synchrotron radiation

Authors
Citation
Cy. Ng, Advances in photoionization and photoelectron studies using third generation synchrotron radiation, J ELEC SPEC, 108(1-3), 2000, pp. 41-45
Citations number
27
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
108
Issue
1-3
Year of publication
2000
Pages
41 - 45
Database
ISI
SICI code
0368-2048(200007)108:1-3<41:AIPAPS>2.0.ZU;2-R
Abstract
In the past few years, we have established a unique high-resolution photoio nization-photoelectron facility at the Chemical Dynamics Beamline of the Ad vanced Light Source. By combining a 6.65-m off-plane Eagle mounted scanning monochromator with the undulator synchrotron radiation source, we have dem onstrated photon energy resolving powers up to E/Delta E = 72,000-100,000 i n the photon energy range of 6-27 eV. We have also developed novel synchrot ron-based pulsed field ionization photoelectron (PFI-PE) detection schemes, achieving resolutions of 1-6 cm(-1) (FWHM). Using the specially designed p hotoelectron-photoion apparatus, which features a supersonic molecular beam source and opposing electron and ion time-of-flight spectrometers, we have recently succeeded in performing synchrotron-based PFI-PE photoion coincid ence experiments, attaining resolutions limited only by the PFI-PE measurem ents. Most recently, we have demonstrated a generally applicable synchrotro n-based scheme for PF1-photoion measurements. The PFI-PEPICO and PFI-PI met hods are expected to have a significant impact in future reaction dynamics studies involving the preparation of rovibronically state-selected reactant ions. (C) 2000 Elsevier Science B.V. All rights reserved.