Raman characterization of GaN synthesized by N implantation in GaAs substrate

Citation
B. Boudart et al., Raman characterization of GaN synthesized by N implantation in GaAs substrate, J RAMAN SP, 31(7), 2000, pp. 615-618
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF RAMAN SPECTROSCOPY
ISSN journal
03770486 → ACNP
Volume
31
Issue
7
Year of publication
2000
Pages
615 - 618
Database
ISI
SICI code
0377-0486(200007)31:7<615:RCOGSB>2.0.ZU;2-3
Abstract
GaN material was synthesized by implantation of N ion into a GaAs (001) sem i-insulating substrate. After implantation, different annealing treatments were applied and the results were investigated using UV Raman spectroscopy. More particularly, temperature and time treatments ranging between 500 and 950 degrees C and 1 and 20 min, respectively, were studied. The results of these studies showed that, by using appropriate annealing conditions, a hi gh-quality GaN crystalline layer can be obtained on GaAs substrates, Copyri ght (C) 2000 John Wiley & Sons, Ltd.