Implementation of diffraction-enhanced imaging experiments: at the NSLS and APS

Authors
Zhong, Z Thomlinson, W Chapman, D Sayers, D
Citation
Z. Zhong et al., Implementation of diffraction-enhanced imaging experiments: at the NSLS and APS, NUCL INST A, 450(2-3), 2000, pp. 556-567
Citations number
18
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
450
Issue
2-3
Year of publication
2000
Pages
556 - 567
Database
ISI
SICI code
0168-9002(20000811)450:2-3<556:IODIEA>2.0.ZU;2-I
Abstract
Diffraction-enhanced imaging is a recently developed X-ray imaging techniqu e that has demonstrated enhanced contrast for dense, highly absorbing mater ials of interest in materials science and medicine. The implementation of t his technique in experiments at the National Synchrotron Light Source and a t the Advanced Photon Source is described in detail. (C) 2000 Elsevier Scie nce B.V. All rights reserved.