We investigated experimentally the morphological evolution of thin polydime
thylsiloxane films sandwiched between a silicon wafer and different boundin
g liquids with interfacial tensions varying by 2 orders of magnitude. It is
shown that increasing the compatibility between film and bounding liquid b
y adding a few surfactant molecules results in a faster instability of shor
ter characteristic wavelength. Inversely, based on the characteristic param
eters describing the instability we determined extremely small interfacial
tensions with a remarkable accuracy.