Enhanced instability in thin liquid films by improved compatibility

Citation
G. Reiter et al., Enhanced instability in thin liquid films by improved compatibility, PHYS REV L, 85(7), 2000, pp. 1432-1435
Citations number
25
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
85
Issue
7
Year of publication
2000
Pages
1432 - 1435
Database
ISI
SICI code
0031-9007(20000814)85:7<1432:EIITLF>2.0.ZU;2-Y
Abstract
We investigated experimentally the morphological evolution of thin polydime thylsiloxane films sandwiched between a silicon wafer and different boundin g liquids with interfacial tensions varying by 2 orders of magnitude. It is shown that increasing the compatibility between film and bounding liquid b y adding a few surfactant molecules results in a faster instability of shor ter characteristic wavelength. Inversely, based on the characteristic param eters describing the instability we determined extremely small interfacial tensions with a remarkable accuracy.