Epitaxial growth and properties of thin film oxides

Authors
Citation
Sa. Chambers, Epitaxial growth and properties of thin film oxides, SURF SCI R, 39(5-6), 2000, pp. 105-180
Citations number
205
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE REPORTS
ISSN journal
01675729 → ACNP
Volume
39
Issue
5-6
Year of publication
2000
Pages
105 - 180
Database
ISI
SICI code
0167-5729(2000)39:5-6<105:EGAPOT>2.0.ZU;2-2
Abstract
Oxide film growth by molecular beam epitaxy for the purpose of preparing me tal oxides for surface science studies is discussed and reviewed. Critical issues such as the choice of oxidizing gas, the selection of substrates, cr ystal symmetry and lattice match, interface chemistry, and the relationship of these issues to the materials science of oxide-on-metal and oxide-on-ox ide film growth are discussed. Recent work on the growth of select, represe ntative oxides that span the ranges of crystal structure, metal oxidation s tate, and stoichiometry is reviewed and used to illustrate the basic materi als science. (C) 2000 Elsevier Science B.V. All rights reserved.