Novel single and double output TSC CMOS checkers for m-out-of-n codes

This paper presents a novel method for designing Totally Self-Checking (TSC ) m-out-of-n code checkers taking into account a realistic fault model incl uding stuck-at, transistor stuck-on, transistor stuck-open, resistive bridg ing faults and breaks. The proposed design method is the first method in th e open literature that takes into account a realistic fault model and can b e applied for most practical values of m and nl Apart from the above the pr oposed checkers are very compact and very fast. The single output checkers are near optimal with respect to the number of transistors required for the ir implementation. Another benefit of the proposed TSC checkers is that all faults are tested by a very small set of single pattern tests, thus the pr obability of achieving the TSC goal is greater than in checkers requiring t wo-pattern tests. The single output TSC checkers proposed in this paper are the first known single output TSC checkers for m-out-of-n codes.