We present a method for integrating an isolated cell membrane patch into a
semiconductor device. The semiconductor is nanostructured for probing nativ
e cell membranes for scanning probe microscopy in situ. Apertures were etch
ed into suspended silicon-nitride layers on a silicon substrate using stand
ard optical lithography as well as electron-beam lithography in combination
with reactive ion etching. Apertures of 1 mu m diam were routinely fabrica
ted and a reduction in size down to 50 nm was achieved. The stable integrat
ion of cell membranes was verified by confocal fluorescence microscopy in s
itu. (C) 2000 American Institute of Physics. [S0003-6951(00)01834-9].