Hb. Wang et al., Individual Shapiro steps observed in resistively shunted intrinsic Josephson junctions on Bi2Sr2CaCu2O8+x single crystals, APPL PHYS L, 77(7), 2000, pp. 1017-1019
With a thin gold layer, we fabricated mesa-like shunted intrinsic Josephson
junction stacks on Bi2Sr2CaCu2O8+x single crystals. Instead of the multibr
anch structure and large voltage jumps often observed in conventional intri
nsic junctions, current-voltage characteristics typical of resistively shun
ted junctions were obtained. Individual Shapiro steps were clearly visible
with irradiation at frequencies from a few to 20 GHz. The experiments demon
strated not only the ac Josephson effects directly but also the possibility
of employing intrinsic Josephson junctions in high-frequency applications.
(C) 2000 American Institute of Physics. [S0003-6951(00)00533-7].