Dielectric properties of lead zirconate titanate thin films deposited on metal foils

Citation
Q. Zou et al., Dielectric properties of lead zirconate titanate thin films deposited on metal foils, APPL PHYS L, 77(7), 2000, pp. 1038-1040
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
7
Year of publication
2000
Pages
1038 - 1040
Database
ISI
SICI code
0003-6951(20000814)77:7<1038:DPOLZT>2.0.ZU;2-2
Abstract
Ferroelectric lead zirconate titanate (PZT) thin films deposited on metal f oil substrates are suitable for developing a wide range of applications. In this letter, we report on PZT films deposited on a variety of foils, inclu ding titanium, stainless steel, brass, and nickel alloys, using sol-gel pro cessing. The dielectric properties were shown to depend strongly on the foi l material. Excellent properties for capacitors, including high dielectric constant (epsilon = 400), low dielectric loss (loss tangent of < 5%), and l ow leakage current (below 5 x 10(-8) A at 5 V) were obtained on titanium an d good results were also obtained on other foils, such as stainless steel a nd brass foils. Also, excellent high-frequency properties were observed for capacitors on titanium, stainless steel, and brass foils. (C) 2000 America n Institute of Physics. [S0003-6951(00)04033-X].