A phenomenon called near-field surface photovoltage is presented. It is bas
ed on inducing photovoltage only at a semiconductor space-charge region usi
ng near-field illumination. The photovoltage is obtained by measuring the c
ontact potential difference between an optical near-field force sensor and
a semiconductor surface under illumination. It is shown that the near-field
illumination induces photovoltage at the surface which is principally diff
erent from photovoltage induced by far-field illumination. The mechanisms t
hat govern the different far-field and near-field photovoltage response are
discussed. (C) 2000 American Institute of Physics. [S0003- 6951(00)04132-2
].