Nanometer scale apertureless near field microscopy

It is necessary to use the information contained in the near field to get s ub-wavelength details in optical imaging which are not revealed through the far-field image. We have designed and built various setups able to perform , near-field measurements in the UV, visible and IR, both in transmission, reflection and dark field with a resolution of 10 nm, independent of the wa velength but related to the tip size. Images revealing local dielectric con trasts, small particle effects, as well as local field enhancements in rand om structures, are shown. (C) 2000 Published by Elsevier Science B.V.