Scanning tunneling microscopy as a probe for photophysical properties of metal nanostructures

Citation
Ao. Gusev et F. Charra, Scanning tunneling microscopy as a probe for photophysical properties of metal nanostructures, APPL SURF S, 164, 2000, pp. 268-274
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
164
Year of publication
2000
Pages
268 - 274
Database
ISI
SICI code
0169-4332(20000901)164:<268:STMAAP>2.0.ZU;2-1
Abstract
We report the results of STM-induced photon emission experiments performed on several types of nanostructures deposited or fabricated onto atomically flat (111) gold surfaces. We demonstrate the simultaneous observation of co ntrasts both from chemically inhomogeneous and homogeneous nanostructures. In the latter case the mechanisms of the contrast involves only geometrical factors and we observe a resonance in excitation spectroscopy that we attr ibute to a localized plasmon oscillation mode. Our results illustrate the o pportunities offered by STM-induced photon emission experiments as a photop hysical probe technique with high-spatial resolution. (C) 2000 Elsevier Sci ence B.V. All rights reserved.