Semiconductor on metal adsorption: Ge tetramers on the Ag(001) surface

Citation
H. Oughaddou et al., Semiconductor on metal adsorption: Ge tetramers on the Ag(001) surface, APPL SURF S, 162, 2000, pp. 74-77
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
162
Year of publication
2000
Pages
74 - 77
Database
ISI
SICI code
0169-4332(200008)162:<74:SOMAGT>2.0.ZU;2-X
Abstract
This paper presents an experimental study of the first stages of the growth of a semiconductor (Ge) deposited at room temperature on an oriented metal lic surface (Ag(001)). It is achieved by using scanning tunneling microscop y (STM), Auger electron spectroscopy (AES), low energy electron diffraction (LEED) and photoelectron spectroscopy (PES). This work shows particular st able entities of four Ge atoms (tetramers) which are observed as early as t he first stages of growth (0.1 ML) in coexistence with isolated Ge atoms in serted in substitutional sites of the Ag top layer. These tetramers order i n a p(2 root 2 x 4 root 2)R45 degrees superstructure at half monolayer (0.5 Ge ML). Beyond this coverage, the adlayer disorders. The PES study reveals the metallic character of the Ge adlayer at least up to 0.5 ML. (C) 2000 E lsevier Science B.V. All rights reserved.