First stages in the formation of ultra thin nickel layers on Cu(111) and Ge(111) and dissolution: an AES comparative study

Citation
C. Girardeaux et al., First stages in the formation of ultra thin nickel layers on Cu(111) and Ge(111) and dissolution: an AES comparative study, APPL SURF S, 162, 2000, pp. 208-212
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
162
Year of publication
2000
Pages
208 - 212
Database
ISI
SICI code
0169-4332(200008)162:<208:FSITFO>2.0.ZU;2-T
Abstract
In this paper we present a low energy electron diffraction (LEED)-Auger ele ctron spectroscopy (AES) comparative study of slow deposition of nickel vap or onto clean Cu(111) and Ge(111) substrates at room temperature and dissol ution of the as-deposited ultrathin Ni layers at higher temperature. The ma in results of the present investigation are: (i) the growth of nickel on Cu (111) occurs via a layer-by-layer or a simultaneous multilayers growth mode and epitaxial pseudomorphic Ni layers are obtained in agreement with previ ous studies, and (ii) the growth of nickel on Ge(111) is described consider ing the partial formation of a surface compound and/or Ge surface segregati on during deposition. Annealings of the as-deposited Ni layers confirm thes e results: when the mass transport is high enough a complete dissolution of nickel in copper is observed while superficial nickel germanide formation is obtained on germanium according to the phase diagrams of the systems. (C ) 2000 Elsevier Science B.V. All rights reserved.