MBE-growth of novel MnF2-CaF2 superlattices on Si(111) and their characterization

Novel short-period MnF2-CaF2 superlattices (SLs) on Si(111) substrates have been grown by molecular beam epitaxy. The thickness of a MnF2 layer was 1- 3 molecular layers. Reflection high-energy electron diffraction studies ind icated the fluorite type of crystal structure of these layers. Fluorescent extended X-ray absorption fine structure measurements supported this observ ation. Atomic force microscopy measurements showed a flat surface morpholog y of the SLs. X-ray diffraction measurements revealed well-pronounced super structural reflections. The width of their omega-curve did not exceed 2.5 a re min, which indicated a good crystal quality of the SLs. (C) 2000 Elsevie r Science B.V. All rights reserved.