Using atomic force microscopy (AFM) imaging, transmission electron microsco
py (TEM) and photoluminescence (PL), we have studied InAs stacked islands o
n InP(001) versus the InAlAs spacer layer thickness (SLT). We have found th
at first wire-libe island shape is strongly favored by such a stacking proc
ess and second in the 10-25 nm SLT range, the wire size and height are depe
ndent on the SLT. TEM images show off a new surprising staggered vertical i
sland organization that can be explained by the phase separation appearing
in the InAlAs spacer layers. (C) 2000 Elsevier Science B.V. All rights rese
rved.