An overview of the formation of reconstructed facets on vicinal surfaces of
Si(111), Si(100) and Si(110) is given, which have been observed by using s
canning tunneling microscopy (STM). Most of the samples have been prepared
by mechanical grinding, subsequent chemical etching leading to concave-shap
ed surfaces and by in situ treatment of high-index Si wafers. The orientati
on of the experimentally observed facets are represented in a stereographic
projection, which allows the recognition of more general trends in facet f
ormation. Moreover, it provides information on the availability of unit cel
ls in a wide range of sizes and may therefore become important for the grow
th of self-organized surface structures. (C) 2000 Published by Elsevier Sci
ence B.V.