Various Zn diffusion profiles in InGaAsSb photovoltaic cells with diffused
emitters were experimentally studied. It was determined that strong built-i
n electric fields near the surface lead to a reduction of the saturation va
lue of the injection (J(01)) component of the dark current, and hence to th
e increase of the open-circuit voltage (V-oc). A value of J(01) as low as 4
.2 x 10(-6) A/cm(2) and a value of V-oc as high as 344 mV at 3 A/cm(2) were
measured.