K. Fujii et al., Monte Carlo simulation of generations of continuous and characteristic X-rays by electron impact, JPN J A P 1, 39(5A), 2000, pp. 2863-2864
A new Monte Carlo (MC) simulation code has been developed to describe the s
pectra of not only continuous X-rays but also characteristic X-rays. The si
mulation code is developed using the Kirkpatrick-Wiedmann-Statham equation
and the formulae derived by Casnati and Gryzinski to describe generations o
f continuous X-rays and characteristic X-rays, respectively. The results in
dicate that a series of experimental X-ray spectra from W films of differen
t thickness on Cu substrates have been reproduced by the present MC simulat
ion with considerable success. A practical application for designing the op
timum construction of a rotor-type X-ray source is also presented.