Monte Carlo simulation of generations of continuous and characteristic X-rays by electron impact

Citation
K. Fujii et al., Monte Carlo simulation of generations of continuous and characteristic X-rays by electron impact, JPN J A P 1, 39(5A), 2000, pp. 2863-2864
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
39
Issue
5A
Year of publication
2000
Pages
2863 - 2864
Database
ISI
SICI code
Abstract
A new Monte Carlo (MC) simulation code has been developed to describe the s pectra of not only continuous X-rays but also characteristic X-rays. The si mulation code is developed using the Kirkpatrick-Wiedmann-Statham equation and the formulae derived by Casnati and Gryzinski to describe generations o f continuous X-rays and characteristic X-rays, respectively. The results in dicate that a series of experimental X-ray spectra from W films of differen t thickness on Cu substrates have been reproduced by the present MC simulat ion with considerable success. A practical application for designing the op timum construction of a rotor-type X-ray source is also presented.