The study of the origin of the anomalously large thermoelectric power of Si/Ge superlattice thin film

Citation
H. Uchino et al., The study of the origin of the anomalously large thermoelectric power of Si/Ge superlattice thin film, JPN J A P 1, 39(4A), 2000, pp. 1675-1677
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
39
Issue
4A
Year of publication
2000
Pages
1675 - 1677
Database
ISI
SICI code
Abstract
We present the experimental framework Tor the origin of the anomalously lar ge thermoelectric power for Si and Au-doped Ge superlattice thin film. The thermoelectric power of the sample still remains anomalously large even tho ugh the superlattice structure begins to collapse. An amorphous Ge thin fil m displays large thermoelectric power. The crystallized samples have almost the same thermoelectric power as that of conventional SiGe bulk samples. T he main cause of this anomalously large thermoelectric power of Si/Ge super lattice thin films is amorphous Ge layer.