H. Uchino et al., The study of the origin of the anomalously large thermoelectric power of Si/Ge superlattice thin film, JPN J A P 1, 39(4A), 2000, pp. 1675-1677
We present the experimental framework Tor the origin of the anomalously lar
ge thermoelectric power for Si and Au-doped Ge superlattice thin film. The
thermoelectric power of the sample still remains anomalously large even tho
ugh the superlattice structure begins to collapse. An amorphous Ge thin fil
m displays large thermoelectric power. The crystallized samples have almost
the same thermoelectric power as that of conventional SiGe bulk samples. T
he main cause of this anomalously large thermoelectric power of Si/Ge super
lattice thin films is amorphous Ge layer.