Anomalous phosphorus cracker temperature-dependent photoluminescence spectra of InGaP grown by solid source molecular beam epitaxy

Citation
Yc. Cheng et al., Anomalous phosphorus cracker temperature-dependent photoluminescence spectra of InGaP grown by solid source molecular beam epitaxy, JPN J A P 2, 39(8A), 2000, pp. L819-L821
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
39
Issue
8A
Year of publication
2000
Pages
L819 - L821
Database
ISI
SICI code
Abstract
InGaP grown by solid source molecular beam epitaxy showed lower effective b and-gap energy with increasing phosphorus cracker temperature. Anomalous ph otoluminescence (PL) spectra also indicated that a weaker ordering effect w as initiated when the cracker temperature was higher. Since the variation o f cracker temperature mainly changed the P-2/P-4 ratio, we believe that the more chemically reactive P-2 incorporates more In into the epilayer. There fore, InGaP grown under a more Pt-rich condition has a higher In content wh ich results in the lower band-gap energy instead of having an ordering effe ct.