Thermal stability of artificial SrTiO3/SrO superlattice epitaxially grown on SrTiO3 single crystal

Citation
Y. Iwazaki et al., Thermal stability of artificial SrTiO3/SrO superlattice epitaxially grown on SrTiO3 single crystal, JPN J A P 2, 39(4A), 2000, pp. L303-L305
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
39
Issue
4A
Year of publication
2000
Pages
L303 - L305
Database
ISI
SICI code
Abstract
A post-annealed artificial (SrTiO3)(5)/SrO superlattice frown on a (100) Sr TiO3 single crystal substrate was characterized by X-ray diffraction (XRD) and transmission electron microscopy (TEM), to investigate the thermal stab ility of inserted rock-salt layers of SrO, the so-called Ruddlesden-Popper (RP) layers, in the epitaxial thin film. The intensities of XRD satellite p eaks stemming il um the superstructure decreased with increasing annealing temperature and almost disappeared at 1000 degrees C. The high-resolution c ross-sectional TEM image of the superlattice after annealing at 1000 degree s C showed that RP layers perpendicular to the film surface appeared, which was predominant over in-plane RP layers. The predominant formation of the vertical RP layers may be attributed to the strain release of RP layers at the film surface.