Y. Iwazaki et al., Thermal stability of artificial SrTiO3/SrO superlattice epitaxially grown on SrTiO3 single crystal, JPN J A P 2, 39(4A), 2000, pp. L303-L305
A post-annealed artificial (SrTiO3)(5)/SrO superlattice frown on a (100) Sr
TiO3 single crystal substrate was characterized by X-ray diffraction (XRD)
and transmission electron microscopy (TEM), to investigate the thermal stab
ility of inserted rock-salt layers of SrO, the so-called Ruddlesden-Popper
(RP) layers, in the epitaxial thin film. The intensities of XRD satellite p
eaks stemming il um the superstructure decreased with increasing annealing
temperature and almost disappeared at 1000 degrees C. The high-resolution c
ross-sectional TEM image of the superlattice after annealing at 1000 degree
s C showed that RP layers perpendicular to the film surface appeared, which
was predominant over in-plane RP layers. The predominant formation of the
vertical RP layers may be attributed to the strain release of RP layers at
the film surface.