N. Richard, Polarization and spectroscopy analysis of the scattering by nanoscopic objects in the near-field optics, J APPL PHYS, 88(5), 2000, pp. 2318-2325
We show, in this article, the polarization effects around nanoscopic object
s in the near-field optics. This analysis accounts of the variation of the
total electric field intensity scattered by the objects with the incident w
avelength. These are illuminated through a transparent glass substrate unde
r the condition of total internal reflection. The use of different material
s is discussed in the optical images according to the incident wavelength a
t constant height. Using numerical simulations based on the Green's dyadic
technique, we compute the total transmitted intensity of the scattered ligh
t in the attenuated total reflection configuration at constant height by va
rying the incident wavelength. The role of localized plasmon resonance is b
rought to the fore in the optical images for nanoscopic and metallic object
s. (C) 2000 American Institute of Physics. [S0021-8979(00)06617-2].