Polarization and spectroscopy analysis of the scattering by nanoscopic objects in the near-field optics

Authors
Citation
N. Richard, Polarization and spectroscopy analysis of the scattering by nanoscopic objects in the near-field optics, J APPL PHYS, 88(5), 2000, pp. 2318-2325
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
5
Year of publication
2000
Pages
2318 - 2325
Database
ISI
SICI code
0021-8979(20000901)88:5<2318:PASAOT>2.0.ZU;2-D
Abstract
We show, in this article, the polarization effects around nanoscopic object s in the near-field optics. This analysis accounts of the variation of the total electric field intensity scattered by the objects with the incident w avelength. These are illuminated through a transparent glass substrate unde r the condition of total internal reflection. The use of different material s is discussed in the optical images according to the incident wavelength a t constant height. Using numerical simulations based on the Green's dyadic technique, we compute the total transmitted intensity of the scattered ligh t in the attenuated total reflection configuration at constant height by va rying the incident wavelength. The role of localized plasmon resonance is b rought to the fore in the optical images for nanoscopic and metallic object s. (C) 2000 American Institute of Physics. [S0021-8979(00)06617-2].